Design considerations for a CMOS 65-nm RTN-based PUF.
Eros Camacho-RuizF. J. Rubio-BarberoRafael Castro-LópezElisenda RocaFrancisco V. FernándezPublished in: SMACD (2023)
Keyphrases
- design considerations
- low voltage
- random access memory
- silicon on insulator
- cmos technology
- metal oxide semiconductor
- nm technology
- electronic devices
- power consumption
- low power
- high speed
- low cost
- power supply
- analog vlsi
- pedagogical agents
- image sensor
- transmission electron microscopy
- real time
- power dissipation
- single chip
- circuit design
- image processing algorithms