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Spin-polarized scanning electron microscopy.

Rolf Allenspach
Published in: IBM J. Res. Dev. (2000)
Keyphrases
  • electron microscopy
  • low energy
  • x ray
  • image stacks
  • thin film
  • scan data
  • structured light
  • spatially varying
  • room temperature
  • image processing
  • microscopy images
  • transmission electron microscopy
  • neural nets