Gate-level aged timing simulation methodology for hot-carrier reliability assurance.
Yoshiyuki KawakamiJingkun FangHirokazu YonezawaNobufusa IwanishiLifeng WuAlvin I-Hsien ChenNorio KoikePing ChenChune-Sin YehZhihong LiuPublished in: ASP-DAC (2000)
Keyphrases
- discrete event simulation
- reliability assessment
- simulation model
- case study
- higher level
- statistical methods
- information security
- agent based simulations
- total energy
- reliability analysis
- levels of abstraction
- mathematical models
- real time
- numerical simulations
- simulation study
- wireless sensor networks
- information systems
- social networks