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Embedded test control schemes using iBIST for SOCs.

Douglas KaySung ChungSamiha Mourad
Published in: IEEE Trans. Instrum. Meas. (2005)
Keyphrases
  • test data
  • three dimensional
  • embedded systems
  • statistical tests
  • real time
  • genetic algorithm
  • image processing
  • image segmentation
  • cooperative
  • digital libraries
  • special case