A Reliable 1T1C FeRAM Using a Thermal History Tracking 2T2C Dual Reference Level Technique for a Smart Card Application Chip.
Shoichiro KawashimaIsao FukushiKeizo MoritaKen-ichi NakabayashiMitsuharu NakazawaKazuaki YamaneTomohisa HirayamaToru EndoPublished in: IEICE Trans. Electron. (2007)