Low-Jitter GaN E-HEMT Gate Driver With High Common-Mode Voltage Transient Immunity.

Mario Mauerer Arda Tuysuz Johann W. Kolar

Published in: IEEE Trans. Ind. Electron. (2017)

Keyphrases

high levels
wide range
significantly lower
steady state
high sensitivity
high noise
high rate
power system
small size
neural network
efficient implementation
structuring elements
high correlation
metal oxide
short circuit
low voltage
transmission line
packet loss
high precision
video sequences
image processing