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Robust inference for destructive one-shot device test data under Weibull lifetimes and competing risks.

N. BalakrishnanElena Castilla
Published in: J. Comput. Appl. Math. (2024)
Keyphrases
  • test data
  • test cases
  • training data
  • test set
  • training set
  • data sets
  • data mining
  • feature vectors
  • xml documents
  • object oriented
  • training and test data