Noninvasive Fault Classification, Robustness and Recovery Time Measurement in Microprocessor-Type Architectures Subjected to Radiation-Induced Errors.
Hipólito Guzmán-MirandaM. A. AguirreJonathan Noel TombsPublished in: IEEE Trans. Instrum. Meas. (2009)
Keyphrases
- classification accuracy
- error detection
- pattern recognition
- classification scheme
- feature vectors
- support vector
- image classification
- support vector machine
- pattern classification
- classification method
- classification systems
- false negative
- automatic classification
- classification algorithm
- support vector machine svm
- machine learning algorithms
- measurement error
- special purpose hardware
- classification models
- cost sensitive
- decision trees
- feature set
- supervised learning
- feature space
- feature extraction