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7nm FinFET standard cell layout characterization and power density prediction in near- and super-threshold voltage regimes.

Tiansong CuiQing XieYanzhi WangShahin NazarianMassoud Pedram
Published in: IGCC (2014)
Keyphrases
  • prediction accuracy
  • prediction model
  • power system
  • power consumption
  • prediction error
  • prediction algorithm
  • threshold selection
  • reactive power
  • metal oxide
  • power losses