A general purpose design-for-test methodology at the analog-digital boundary of mixed-signal VLSI.
Johan VerfaillieDidier HaspeslaghPublished in: J. Electron. Test. (1996)
Keyphrases
- mixed signal
- vlsi circuits
- low power
- multi channel
- general purpose
- digital circuits
- cmos technology
- high speed
- analog to digital converter
- low cost
- power consumption
- single chip
- power dissipation
- real time
- vlsi architecture
- low voltage
- computer vision
- circuit design
- vlsi design
- design methodology
- test cases
- cmos image sensor