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Nonlinear delay-table approach for full-chip NBTI degradation prediction.

Song BianMichihiro ShintaniShumpei MoritaMasayuki HiromotoTakashi Sato
Published in: ISQED (2016)
Keyphrases
  • prediction accuracy
  • low cost
  • prediction error
  • prediction algorithm
  • database
  • genetic algorithm
  • prediction model
  • real time
  • nonlinear models
  • power dissipation
  • vlsi implementation
  • analog vlsi
  • phase locked loop