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Compared deep class-AB and class-B ageing on AlGaN/GaN HEMT in S-Band pulsed-RF operating life.

Jean-Baptiste FonderOlivier LatryCedric DuperrierM. StanislawiakHichame MaananePhilippe EudelineFarid Temcamani
Published in: Microelectron. Reliab. (2012)
Keyphrases
  • real time
  • significant improvement
  • databases
  • database
  • neural network
  • genetic algorithm
  • learning algorithm
  • artificial intelligence
  • clustering algorithm
  • multi class classification