Compared deep class-AB and class-B ageing on AlGaN/GaN HEMT in S-Band pulsed-RF operating life.
Jean-Baptiste FonderOlivier LatryCedric DuperrierM. StanislawiakHichame MaananePhilippe EudelineFarid TemcamaniPublished in: Microelectron. Reliab. (2012)