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Impact of substrate resistance and layout on passivation etch-induced wafer arcing and reliability.
Po Li
Yung-Cheng Wang
Jing-Wei Peng
David Wei Zhang
Published in:
Microelectron. Reliab. (2015)
Keyphrases
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manufacturing process
semiconductor manufacturing
high impact
database systems
databases
real world
genetic algorithm
information systems
data structure
process control
highly reliable