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Investigation of transfer-free catalytic CVD graphene on SiO2 by means of conductive atomic force microscopy.

Dennis NollUdo Schwalke
Published in: DTIS (2016)
Keyphrases
  • atomic force microscopy
  • data mining
  • multiscale
  • data structure
  • transfer learning
  • artificial intelligence
  • high level
  • pairwise
  • literature review