: Features with memory information extracted from unlabeled data and their application on industrial unsupervised industrial fault detection.
Jianbo YuXuefeng YanPublished in: Appl. Soft Comput. (2021)
Keyphrases
- semi supervised
- fault detection
- unlabeled data
- industrial processes
- semi supervised learning
- supervised learning
- prior knowledge
- labeled data
- feature extraction
- active learning
- feature vectors
- unsupervised learning
- data sets
- feature set
- feature space
- constraint satisfaction problems
- fault diagnosis
- multiple sources
- training data
- weakly supervised
- semi supervised classification