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A Unified Label Noise-Tolerant Framework of Deep Learning-Based Fault Diagnosis via a Bounded Neural Network.
Sudao He
Wai Kei Ao
Yi-Qing Ni
Published in:
IEEE Trans. Instrum. Meas. (2024)
Keyphrases
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fault diagnosis
neural network
deep learning
noise tolerant
bp neural network
fault detection
fuzzy logic
expert systems
machine learning
analog circuits
unsupervised learning
back propagation
data sets
artificial intelligence
pattern recognition