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Dimitris Gizopoulos, Antonis Paschalis and Yervant Zorian, Embedded Processor-Based Self Test , Kluwer Academic Publishers, Dordrecht (2004) ISBN 1-4020-2785-0 217 pp., Hardcover, plus XV.

Mile K. Stojcev
Published in: Microelectron. Reliab. (2008)
Keyphrases
  • parallel processing
  • high speed
  • test data
  • database
  • test cases
  • multiprocessor systems
  • real time
  • data sets
  • genetic algorithm
  • information systems
  • wireless sensor networks
  • third party
  • linked data