Design Considerations for Low-Distortion Filter and Oscillator ICs for Testing High-Resolution ADCs.
Sangeeta KumarRajashekar GorojuDileep Kumar BhatK. S. RakshitdattaNagendra KrishnapuraPublished in: IEEE Trans. Circuits Syst. I Regul. Pap. (2019)
Keyphrases
- design considerations
- high resolution
- low resolution
- image processing
- super resolution
- high quality
- high frequency
- low voltage
- differential equations
- random access memory
- field of view
- test cases
- noise reduction
- satellite images
- pedagogical agents
- low resolution images
- high resolution images
- language learning
- color images