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Linked faults in random access memories: concept, fault models, test algorithms, and industrial results.

Said HamdiouiZaid Al-ArsAd J. van de GoorMike Rodgers
Published in: IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. (2004)
Keyphrases
  • random access
  • fault models
  • model based diagnosis
  • fault management
  • machine learning
  • data structure
  • computational complexity
  • knowledge based systems
  • dynamic systems