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Quantification of Sense Amplifier Offset Voltage Degradation due to Zero-and Run-Time Variability.

Innocent AgboMottaqiallah TaouilSaid HamdiouiPieter WeckxStefan CosemansPraveen RaghavanFrancky CatthoorWim Dehaene
Published in: ISVLSI (2016)
Keyphrases
  • power system
  • dynamic range
  • high power
  • databases
  • high sensitivity
  • high speed
  • quantitative evaluation
  • intra class
  • transmission line
  • power supply
  • software product line
  • high voltage