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A unified gate sizing formulation for optimizing soft error rate, cross-talk noise and power under process variations.

Koustav BhattacharyaNagarajan Ranganathan
Published in: ISQED (2009)
Keyphrases
  • error rate
  • test set
  • noise level
  • misclassification rate
  • information retrieval
  • estimation error
  • cost sensitive classification
  • power losses
  • machine learning
  • rule sets
  • noise reduction
  • equal error rate