A Voltage-Mode Testing Method to Detect IDDQ Defects in Digital Circuits.

Josep Rius Luis Elvira Villagra Maurice Meijer

Published in: ETS (2009)

Keyphrases

detection method
detection algorithm
significant improvement
digital circuits
similarity measure
classification accuracy
multi agent systems
dynamic programming
database
databases
neural network
database systems
multi agent
feature set
correlation analysis