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Optimal multi-row detailed placement for yield and model-hardware correlation improvements in sub-10nm VLSI.
Changho Han
Kwangsoo Han
Andrew B. Kahng
Hyein Lee
Lutong Wang
Bangqi Xu
Published in:
ICCAD (2017)
Keyphrases
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high level
formal model
computational model
sensitivity analysis
experimental data
statistical model
power law
data sets
parameter values
neural network model
parameter estimation
theoretical analysis
input data
high speed
low cost
hidden markov models
objective function