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From sylvester-gallai configurations to rank bounds: Improved blackbox identity test for depth-3 circuits.

Nitin SaxenaC. Seshadhri
Published in: J. ACM (2013)
Keyphrases
  • lower bound
  • upper bound
  • worst case
  • case study
  • high speed
  • test data
  • circuit design
  • error bounds
  • improved algorithm
  • statistical significance
  • average case
  • digital circuits