Partition Based SoC Test Scheduling with Thermal and Power Constraints under Deep Submicron Technologies.
Chunhua YaoKewal K. SalujaParameswaran RamanathanPublished in: Asian Test Symposium (2009)
Keyphrases
- low power
- power consumption
- resource constraints
- scheduling problem
- economic load dispatch
- constrained optimization
- precedence constraints
- electron beam
- utility computing
- data mining
- constraint satisfaction
- resource allocation
- infrared
- hardware and software
- high speed
- parallel machines
- emerging technologies
- round robin