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Competing causes of failure and reliability tests for Weibull lifetimes under type I progressive censoring.

Uditha BalasooriyaChan-Kee Low
Published in: IEEE Trans. Reliab. (2004)
Keyphrases
  • failure rate
  • highly reliable
  • log normal
  • artificial intelligence
  • type ii
  • reliability analysis
  • failure detection
  • database
  • data sets
  • real world
  • database systems
  • knowledge discovery
  • root cause
  • failure prediction