Automatic defects classification with p-median clustering technique.
Denis N. SidorovWong Soon WeiIgor Vasil'evSaverio SalernoPublished in: ICARCV (2008)
Keyphrases
- unsupervised learning
- clustering algorithm
- clustering method
- pattern recognition
- unsupervised classification
- pattern classification
- image classification
- statistical classification
- supervised classification
- decision rules
- classification accuracy
- support vector
- machine learning
- training set
- feature vectors
- high dimensionality
- unsupervised clustering
- clustering analysis
- classification systems
- automatic classification
- feature extraction
- benchmark datasets
- preprocessing
- information theoretic
- spectral clustering
- cost sensitive
- density estimation
- features extraction
- neural network
- feature selection
- k means
- text classification
- classification algorithm
- categorical data
- feature space
- data mining
- defect detection
- active learning
- supervised learning
- training data
- model selection
- classification models
- support vector machine svm
- image processing
- learning algorithm
- hierarchical clustering
- self organizing maps
- machine learning methods
- microarray