Improved Automatic Recognition of Engineered Nanoparticles in Scanning Electron Microscopy Images.
Stephen KockentiedtKlaus D. TönniesErhardt GierkeNico DziurowitzCarmen ThimSabine PlitzkoPublished in: VISAPP (2) (2015)
Keyphrases
- automatic recognition
- microscopy images
- electron microscopy
- microscopic images
- x ray
- multi channel
- laser scanning
- character segmentation
- phase contrast images
- confocal images
- phase contrast
- least squares
- structured light
- image reconstruction
- markov random field
- cell division
- white blood cells
- transmission electron microscopy
- cost function