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Failure mechanism analysis of off-state drain-to-source leakage current failure of a commercial 650 V discrete GaN-on-Si HEMT power device by accelerated power cycling test.

Sungyoung SongStig Munk-NielsenChristian Uhrenfeldt
Published in: Microelectron. Reliab. (2017)
Keyphrases
  • power consumption
  • image analysis
  • state space
  • edge detection
  • real time
  • power management