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Siam-VAE: a hybrid deep learning based anomaly detection framework for automated quality control of head CT scans.
Soumyendu Sekhar Ghosh
Rajat Dhar
Daniel S. Marcus
Aristeidis Sotiras
Published in:
Medical Imaging: Computer-Aided Diagnosis (2023)
Keyphrases
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anomaly detection
quality control
deep learning
intrusion detection
ct scans
unsupervised learning
detecting anomalies
network intrusion detection
machine vision
intrusion detection system
neural network
ct images
reinforcement learning
probabilistic model
manufacturing systems