Economic Analysis of Testing Homogeneous Manycore Chips.

Lin Huang Qiang Xu

Published in: IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. (2010)

Keyphrases

economic analysis
artificial intelligence
high speed
test cases
high density
data mining
computer vision
high end
database
decision trees
multiscale
hidden markov models
test set
integrated circuit
software testing