Digital Measurement Technique for Capacitance Variation Detection on Integrated Circuit I/Os.

Yves Blaquière Yvon Savaria Jaouad El Fouladi

Published in: ICECS (2007)

Keyphrases

integrated circuit
high speed
detection method
object detection
detection algorithm
detection rate
false alarms
false positives
automatic detection
metal oxide semiconductor
computer vision
multi dimensional
face detection
cost model
external memory
unit length