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Reliability analysis of combinational circuits with the influences of noise and single-event transients.

Kaikai LiuHao CaiTing AnLirida A. B. NavinerJean-François NavinerHervé Petit
Published in: DFTS (2013)
Keyphrases
  • reliability analysis
  • high speed
  • neural network
  • decision making
  • event detection
  • signal to noise ratio
  • asynchronous circuits