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A New Test Paradigm for Semiconductor Memories in the Nano-Era.
Said Hamdioui
Venkataraman Krishnaswami
Ijeoma Sandra Irobi
Zaid Al-Ars
Published in:
Asian Test Symposium (2011)
Keyphrases
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test data
special case
machine learning
test cases
genetic algorithm
three dimensional
multiscale
evolutionary algorithm
big data
nano scale