Defect Detection in Textures through the Use of Entropy as a Means for Automatically Selecting the Wavelet Decomposition Level.
Pedro Javier Navarro LorenteCarlos Fernández-IslaPedro María AlcoverJuan Suardíaz MuroPublished in: Sensors (2016)
Keyphrases
- wavelet decomposition
- defect detection
- texture characterization
- multiresolution
- wavelet transform
- subband
- textured surfaces
- multiscale
- wavelet domain
- wavelet transformation
- high frequency
- feature vectors
- wavelet packet
- wavelet coefficients
- feature extraction
- denoising
- high speed
- wavelet representation
- mutual information
- computer vision
- texture image retrieval
- image segmentation
- discrete wavelet transform
- human visual system
- image denoising
- machine learning
- image compression
- feature set
- edge detection
- higher order