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The Impact of Classifier Configuration and Classifier Combination on Bug Localization.
Stephen W. Thomas
Meiyappan Nagappan
Dorothea Blostein
Ahmed E. Hassan
Published in:
IEEE Trans. Software Eng. (2013)
Keyphrases
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classifier combination
multiple classifiers
pattern recognition
bug localization
individual classifiers
combining classifiers
probability estimation
word sense disambiguation
classifier ensemble
base classifiers
information retrieval
source code
computer vision