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Accurate error bit mode analysis of STT-MRAM chip with a novel current measurement module implemented to gigabit class memory test system.

Ryo TamuraI. MoriN. WatanabeHiroki KoikeTetsuo Endoh
Published in: NVMTS (2018)
Keyphrases
  • random access memory
  • low voltage
  • high quality
  • high speed
  • error analysis
  • data analysis
  • statistical analysis