Login / Signup
Multi-Bit Differential Fault Analysis of Grain-128 with Very Weak Assumptions.
Prakash Dey
Abhishek Chakraborty
Avishek Adhikari
Debdeep Mukhopadhyay
Published in:
IACR Cryptol. ePrint Arch. (2014)
Keyphrases
</>
machine learning
image analysis
digital images
fault detection
multimedia
case study
data analysis
high speed
statistical analysis
fault diagnosis
qualitative analysis