E-ECC: Low Power Erasure and Error Correction Schemes for Increasing Reliability of Commodity DRAM Systems.
Hsing Min ChenAkhil ArunkumarCarole-Jean WuTrevor N. MudgeChaitali ChakrabartiPublished in: MEMSYS (2015)
Keyphrases
- error correction
- low power
- low density parity check
- channel coding
- error detection
- power consumption
- high speed
- error correcting
- low cost
- ldpc codes
- data hiding
- reed solomon
- digital signal processing
- vlsi architecture
- real time
- image sensor
- data center
- source coding
- turbo codes
- cmos technology
- low power consumption
- high density
- computer simulation
- low complexity