COM (Cost Oriented Memory) Testing.

T. Yamada Akihiro Fujiwara Michiko Inoue

Published in: ITC (1992)

Keyphrases

storage overhead
memory usage
memory requirements
total cost
testing process
cost reduction
minimal cost
early vision
high cost
internal memory
real time
limited memory
software testing
main memory
test data
test set
cost function
objective function
website
information systems
data mining
data sets