Towards Reducing Data Acquisition and Labeling for Defect Detection using Simulated Data.
Lukas Malte KemeterRasmus HvingelbyPaulina SierakTobias SchönBishwajit GosswamPublished in: CoRR (2024)
Keyphrases
- data acquisition
- defect detection
- monitoring system
- high speed
- low cost
- data processing
- real time
- data analysis
- feature extraction
- data collection
- image segmentation
- active learning
- supervisory control
- high throughput
- automated visual inspection
- textured surfaces
- expert systems
- real world
- databases
- data sets
- discrete event
- database