Pipelined ADC with On-Chip Digital Self-Calibration.

Ho-Young Lee Tae-Hwan Oh Ho-Jin Park Hae-Seung Lee Mark Spaeth Jae-Whui Kim

Published in: CICC (2007)

Keyphrases

sigma delta
analog to digital converter
single chip
high speed
circuit design
low cost
cmos image sensor
mixed signal
closed form
camera calibration
high density
phase locked loop
analog vlsi
euclidean reconstruction
multiple views
viewpoint
vlsi implementation
image processing
data flow
power consumption
multi view