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Degradation Mechanisms of Gate Leakage in GaN-Based HEMTs at Low Dose Rate Irradiation.
Xiaolong Li
Xin Wang
Mohan Liu
Kunfeng Zhu
Guohua Shui
Qiwen Zheng
Jiangwei Cui
Wu Lu
Yudong Li
Qi Guo
Published in:
IEEE Access (2024)
Keyphrases
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low dose
x ray
computed tomography
ionizing radiation
dual energy
ct scans
lung nodules
imaging modalities
computer tomography
contrast enhancement
signal dependent noise
leakage current
medical images
ct images
edge detection
image reconstruction