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A parallel built-in self-diagnostic method for nontraditional faults of embedded memory arrays.
Vikram Arora
Wen-Ben Jone
Der-Cheng Huang
Sunil R. Das
Published in:
IEEE Trans. Instrum. Meas. (2004)
Keyphrases
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cost function
preprocessing
experimental evaluation
high accuracy
classification method
computational complexity
synthetic data
significant improvement
dynamic programming
input data
segmentation method
neural network
genetic algorithm
clustering method
high precision