Built-in self-test of a CMOS ALU.
Eduard CernyEl Mostapha AboulhamidGuy BoisJocelyn CloutierPublished in: IEEE Des. Test (1988)
Keyphrases
- built in self test
- integrated circuit
- power supply
- low cost
- floating point
- power consumption
- high speed
- low power
- analog vlsi
- delay insensitive
- vlsi circuits
- hd video
- circuit design
- genetic algorithm
- cmos image sensor
- random access memory
- low voltage
- single chip
- machine learning
- case study
- metal oxide semiconductor
- multi agent systems