Circuits for Pseudo-Exhaustive Test Pattern Generation.
Laung-Terng WangEdward J. McCluskeyPublished in: ITC (1986)
Keyphrases
- high speed
- delay insensitive
- circuit design
- digital circuits
- logic synthesis
- analog circuits
- data sets
- lateral inhibition
- vlsi circuits
- analog vlsi
- exhaustive search
- information retrieval
- probabilistic model
- brute force
- wireless sensor networks
- search space
- expert systems
- logic circuits
- electronic circuits
- data structure
- face recognition
- databases
- chip design
- high level synthesis
- database