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A Study on Shunt Resistor-based Current Measurements for Fast Switching GaN Devices.

Thilini WickramasingheStephane AzzopardiBruno AllardCyril ButtayCharles JoubertChristian MartinJean-François MogniotteHervé MorelPascal BevilacquaThanh-Long Le
Published in: IECON (2019)
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