Defect Modeling During the SLM Process for Manufacturing Microwave Devices.
Shuai LiXiue BaoGiovanni GugliandoloHaoyun YuanJinkai LiLinxiang ShaoMinghe DuNicola DonatoZlatica MarinkovicGiovanni CrupiLili FangLiming SiHoujun SunPublished in: MetroXRAINE (2023)