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Characterization and SPICE modeling of the CHC related time-dependent variability in strained and unstrained pMOSFETs.

Nuria AyalaJavier Martín-MartínezRosana RodríguezM. B. GonzálezMontserrat NafríaXavier AymerichEddy Simoen
Published in: Microelectron. Reliab. (2012)
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