Characterization and SPICE modeling of the CHC related time-dependent variability in strained and unstrained pMOSFETs.
Nuria AyalaJavier Martín-MartínezRosana RodríguezM. B. GonzálezMontserrat NafríaXavier AymerichEddy SimoenPublished in: Microelectron. Reliab. (2012)