Improvement of the tolerated raw bit error rate in NAND flash-based SSDs with the help of embedded statistics.
Valentin GhermanEmna FarjallahJean-Marc ArmaniMarcelino SeifLuigi DililloPublished in: ITC (2017)
Keyphrases
- bit error rate
- flash memory
- embedded systems
- disk drives
- computer simulation
- solid state
- signal to noise ratio
- multipath
- soft decision
- buffer management
- fading channels
- storage medium
- analytical model
- channel coding
- channel estimation
- wireless channels
- ofdm system
- code division multiple access
- low cost
- ultra wideband
- random access
- modulation scheme
- main memory
- file system
- b tree
- ds cdma
- cdma systems
- mc cdma
- data storage